The equipment of WARMC thermal analysis lab includes:
Our scanning 5600 AES/XPS system (PHI, USA) is a state-of-the-art analytical tool for chemical analysis of any solid material, ranging from Li to U.
Source: Tungsten filament
Voltage: 200 V to 30 kV
Beam current: 10-12 to 10-5 A.
The Quanta 200 FEG Environmental Scanning Electron Microscope (ESEM) uses a field-emission gun (FEG) electron source in an exceptionally high chamber pressure environment.
Our PHI Model 2100 TRIFT II system is a state-of-the-art Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) instrument. It uses a pulsed primary ion beam to desorb and ionize species from a sample surface.
– installation in due progress
The X-ray diffraction laboratory is equipped with a Bruker D8 DISCOVER diffractometer.