The X-ray diffraction is the main technique to study the crystalline matter at different level: from finding the phases in an unknown powder to a fine description of the atomic structure of a material. This technique is very versatile because can applied on different field of physics chemistry, biology and material science.
Contact: Dr. Evelina Faktorovich Simon. Telephone: +972-054-3149014. Email: email@example.com
Thermal Analysis is defined as a group of methods based on the determination of changes in chemical or physical properties of material as a function of temperature in a controlled atmosphere. Read More
Head of the Laboraotoy: Dr. George Levi. Office: +972-3-640-9205. Email: firstname.lastname@example.org.
The goal of our TEM Lab is to provide microstructural, morphological and chemical analysis down to sub-nanometer spatial resolution for a wide range of inorganic and organic materials and compounds.
Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a versatile technique, capable of analyzing both organic and inorganic surfaces including biomaterials, polymers, semiconductors, ceramics and advanced composites.
The laboratory main goal is to produce bulk sectioned specimens for analytical investigation purposes.
The laboratory utilizes high precision tools for the mechanically cutting, grinding and polishing of a wide range of solid materials. Thinned specimens are brought to electron transparency using a precision ion polishing system.
The Quanta 200 FEG Environmental Scanning Electron Microscope (ESEM) uses a field-emission gun (FEG) electron source in an exceptionally high chamber pressure environment.
Scanning 5600 AES/XPS multi-technique system (PHI, USA) is a state-of-the-art analytical tool for chemical analysis of any solid material, ranging from Li to U. It can determine the chemical composition of surfaces not only by their atomic content but also by the chemical bonding of the surface atoms.